FAB Services On-Wafer Parametric Testing and PCMs

On-Wafer Parametric Testing and PCMs


The compliance of critical processing steps is gauged by Process Control Monitors (PCMs). They include:

  • Contact and sheet resistance measurements
  • Diode and transistor characteristics measurement (IV curves)
  • Laser and LED characteristic measurements (LIV)

OEpic's OnWaferTesting
 


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